May 1, 2018 (Vol. 38, No. 9)
ZEISS
The GeminiSEM 450, the new field emission scanning electron microscope (FE-SEM), combines ultra-high-resolution imaging with the capability to perform advanced analytics while maintaining flexibility and ease-of-use. Users benefit from high-resolution, surface sensitive imaging and an optical system that ideally supports them in obtaining the best analytical results—especially when working at low voltages. High-throughput electron backscatter diffraction (EBSD) analysis and low-voltage X-ray spectroscopy (EDS) deliver excellent results due to the Gemini 450’s ability to precisely and independently control spot size and beam current. It is possible to always work under optimized conditions as the user can switch seamlessly between imaging and analytical modes at the touch of a button. The GeminiSEM 450 has been designed to cater to a broad variety of sample types from classical conductive metals to beam sensitive polymers.
