Cryo-Electron Microscope

The CRYO ARM™ 300 II is a new cold field emission cryo-electron microscope
(cryo-EM). The company released the CRYO ARM™ 300 in 2017. However, the previous workflow of single-particle analysis using cryo-EM needed multiple electron microscopes because the workflow for sample screening and for image data acquisition are independent
of one another. The new cryo-EM microscope was developed to eliminate the need for multiple electron microscopes and was improved to allow anyone from novice users to professional users to operate the microscope. The company claims this system offers improved stability, throughput, and ease of use compared to the previous generation of
cryo-EMs. With respect to improvements, the company indicates that they focused on high-speed imaging, hardware stability for image acquisition, and higher operability.

JEOL

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